Call for Research in Computer-Aided Design and Test

Semiconductor Research Corp. (SRC) Global Research Collaboration (GRC) is soliciting white papers in the area of Computer-Aided Design and Test. Requested area include: 

System, Logic, and Physical Design Tools:

Tools for Design Robustness

Analog Tools

System Tools

Test:

Test Cost and Quality Improvement

Yield Learning and Improvement

Analog, Mixed-Signal, and RF/High Speed Test

High-Level Test, Diagnosis and Repair

Post-Silicon Validation

Test and Power

Test for New Applications and New Technologies

Verification:

Verification Core Technologies

System-Level Verification including SoC

Analog/Mixed Signal Verification

Security and Emerging Applications of Formal Methods 

Funding: No fixed limit 

Duration: 2-3 years 

White paper (required) due date: 20.4.16

Full proposal due date: 11.7.16